Di Biccari, Leonardo (2010) Characterization of ESD protection structures for 65 nm CMOS technology. [Laurea specialistica biennale]
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ESD phenomena are well known to be extremely dangerous for microelectronic devices. This thesis deals with failures induced by ESD phenomena, starting from the description of main charging events up to the physics beyond the operation of different devices under high current regime. Novel implementations developed in the last years to increase the devices behavior under ESD event was introduced.
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