De Gaspari, Davide (2016) Effetti della Radiazione su transistor in Tecnologia CMOS 28nm. [Laurea triennale]
Full text disponibile come:
In This work the resistance of CMOS transistors was tested against the effects of the irradiations. The divices were irradiated with X ray in the worst bias condition. After it, the parameters of usage of the devices were compared with the same parameters before irradiation trying to understand what happened and how this devices reacted to the irradiation.
Solo per lo Staff dell Archivio: Modifica questo record